Why High Cycle Shock Testing?

Modern products are exposed to repeated mechanical stresses throughout their lifecycle. High cycle shock testing helps you stay ahead by:

• Simulating real-world repetitive impact conditions
• Identifying failure points before they occur in the field
• Validating product durability and lifecycle performance
• Accelerating testing timelines without compromising accuracy

With capabilities of up to 50 shock impacts per minute, these systems significantly enhance testing efficiency and throughput.

HC Series Overview

Choosing the Right System for Your Application

Both HC18 and HC23 systems deliver high-performance shock testing, with differences tailored to test size, configuration, and throughput requirements.

Model HC18

Compact & Efficient for Precision Testing

The HC18 is designed for smaller components and space-constrained environments, offering high-performance shock testing in a compact footprint.

Key Specifications:

• Table Size: 18 × 18 cm
• Maximum Velocity Change: 8.38 m/s
• Maximum Acceleration: 5000 g
• Maximum Payload: 9 kg
• Up to 50 impacts per minute

Design Advantages:

• Forged aluminum table for high-fidelity shock pulse generation
• High-speed lift mechanism for reduced cycle time
• Floating seismic base to minimize floor vibration transmission
• Built for continuous, long-duration operation

Ideal Applications:

• PCB and electronic component testing
• Precision devices and small assemblies
• Laboratory environments with limited space

Model HC23

Expanded Capability for Higher Throughput

The HC23 extends the performance of the HC18 with a larger test platform, enabling greater flexibility and higher throughput.

Key Specifications:

• Table Size: 23 × 23 cm
• Maximum Velocity Change: 8.38 m/s
• Maximum Acceleration: 5000 g
• Maximum Payload: 9 kg
• Up to 50 impacts per minute

Design Advantages:

• Larger surface area for multiple or larger test specimens
• Optional JEDEC table configuration for simultaneous multi-board testing (up to 6 boards)
• Shock pulse programmers for short-duration pulses (0.3 – 2 ms)
• Flexible mounting options for diverse test setups

Ideal Applications:

• Multi-board PCB testing (JEDEC standards)
• Larger electronic assemblies
• High-throughput and production-level testing environments

Integrated Data Acquisition & Analysis

To deliver a complete testing solution, both HC18 and HC23 systems integrate seamlessly with Test Partner™ 4 Data Acquisition Systems, enabling:

• Accurate capture of high-speed shock events
• Reliable storage of large volumes of test data
• Advanced analysis for shock response and performance evaluation

Key Benefits of HC Series Systems

• High cycle rates for accelerated durability testing
• Consistent and repeatable shock pulse performance
• Robust design for continuous operation
• Flexible configurations for wide-ranging applications
• Reduced testing time with enhanced throughput